defect

The ITO line AOI inspection machine (also known as the step electrode automatic inspection machine, terminal scratch automatic inspection machine) is mainly used for defect detection of ITO in the exposed area of TFT-LCD lines, improving production line yield and the process control capability of manufacturers. Mainly detecting scratches, short circuits, open circuits, micro breaks, foreign objects (dirt), corrosion, burrs, etc. The equipment can be widely used in fields such as TFT-LCD industry, touch screen industry, photovoltaic industry, and LED industry, achieving rapid detection of ITO lines, silver paste lines, etc. on glass substrates or flexible substrates (PET, CPI, etc.).

Desktop module appearance AVI inspection is mainly used for defect detection of 3C product appearance, improving production line yield and the process control capability of manufacturers. Mainly detecting scratches, damages, pressure marks, broken edges, gaps, hidden cracks, burrs, warping, foreign objects, dirt, white spots, bubbles, pinholes, bumps and depressions, as well as component errors, leaks, reversals, excess, skewers, offsets, color differences, sizes, segments, etc.

Solid state wire bonding AOI inspection machine, also known as wire bonding AOI inspection machine, is mainly used for efficient AOI inspection of defects after die bonding and wire bonding in the semiconductor packaging and testing field. It has the characteristics of high speed, high precision, and high inspection coverage. Optical system modules and core detection algorithms with completely independent intellectual property rights, as well as AI deep learning algorithms, are suitable for detecting various defects on grain surfaces, solder joints, solder wires, and frame surfaces that occur during the solidification and wire bonding processes.